3D Auto Optical Inspection System for Semiconductor Manufacturing

Product Details
Customization: Available
Magnification: 100-500X
Type: Video
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  • 3D Auto Optical Inspection System for Semiconductor Manufacturing
  • 3D Auto Optical Inspection System for Semiconductor Manufacturing
  • 3D Auto Optical Inspection System for Semiconductor Manufacturing
  • 3D Auto Optical Inspection System for Semiconductor Manufacturing
  • 3D Auto Optical Inspection System for Semiconductor Manufacturing
  • 3D Auto Optical Inspection System for Semiconductor Manufacturing
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Basic Info.

Model NO.
MVA-3020P
Mobility
Desktop
Stereoscopic Effect
Without Stereoscopic Effect
Kind of Light Source
Laser
Shape
Rectangular Prism
Usage
Teaching, Research
Principle
Electronic
Principle of Optics
Polarizing Microscope
Transport Package
Plywood
Specification
CE, ISO
Trademark
SINOWON
Origin
Dongguan, China
HS Code
90314910
Production Capacity
20 Sets/Month

Product Description

3D Fully Auto Vision Measuring Machine MVA Series


Product Introduction:

3D MVA is a classical Fully Auto Vision Measuring Machine, it is equipped with four-axis motorized control and auto zoom lens and probe, powerful function, simple operation, widely application.


3D Auto Optical Inspection System for Semiconductor Manufacturing
Product Characteristics:
  1. Four-axis CNC fully auto close loop control, auto measurement;
  2. "00" grade "JINANQING"marble base and pillar, stable and reliable;
  3. Precision linear guide, grinding ball screw and AC servo motor, ensure accuracy stability of system  position;
  4. High precision linear scale, resolution is 0.5um, high accuracy, great stability;
  5. Imported high definition color industry digital camera, ensure clear observation and stable measurement requirement;
  6. 6.5X continue auto zoom lens, precision auto zoom, only need to make pixel calibration once time;
  7. Programmable 5-ring 8-division LED surface illumination, contour parallel LED illumination, can realize 256 grade brightness adjustment intelligently;
  8. With proprietary powerful function fully auto measuring software iMeasuring 4.2;
Technical Specification:
Product Name 3D Fully Auto Vision Measuring Machine
Model MVA-3020P
Code# 524-360
X/Y-axis Travel(mm) 300x200
Z-axis Travel(mm) 200
X/Y/Z 3-axis
 Linear Scale(mm)
High precision linear scale,resolution:0.0005mm
Guidance Mode Precision linear guide,double-track double slider guide
Operation Mode Joystick controller, Mouse operation, automatic detection program
Measurement Accuracy XY-axis:≤3+L/200
Z-axis:≤5+L/200
Repeatability ±2um
Video System High definition 1/3" Color CCD Camera,
6.5X continue click zoom lens; optical magnification: 0.7X-4.5X; video magnification:126X~172X(21.5"monitor)
Field of View(mm)
(Diagonal * Horizontal*Vertical)
Lens Magnification 0.7x 1x 2.0x 3.0x 4x 4.5x
1/3"CCD 8.57x6.86x5.14 6.00x4.80x3.60 3.00x2.40x1.80 2.00x1.60x1.20 1.50x1.20x0.90 1.33x1.07x0.80
Illumination Contour LED Parallel Contour Illumination
Surface 5-ring 8-division 0~255 grade continue adjustable
Software System iMeasuring 4.2 Fully Auto Measuring Software
Load Capacity (Kg) 25
Working Environment Temperature 20ºC±2ºC,Humidity Range<2ºC/hr,Humidity 30~80%,Vibration<0.002g,<15Hz
Power 220V/50Hz/10A
Dimension(mm) 1200x780x1650
Packing Dimension(mm) 1360x1030x1900
Weight(Kg) 380
* L is measuring length,unit is mm, the mechanical accuracy of Z-axis and focus accuracy is greatly related to the surface of the workpiece.
* * Magnification is approximate value, it is related to the dimension of monitor and resolution.
Customers can choose 0.5X or 2X optional objective, and realize image magnification: 13X~86X or 52X~344X.



Applicaiton:

Semiconductor Manufacturing: Wafers, front-ends, back-ends, and components
3D Auto Optical Inspection System for Semiconductor Manufacturing
Precision Metal Processing: Machining, Stamping, Powder Metallurgy Injection Molding
3D Auto Optical Inspection System for Semiconductor Manufacturing
Precision plastic
3D Auto Optical Inspection System for Semiconductor Manufacturing

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3D Auto Optical Inspection System for Semiconductor Manufacturing
 

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